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Fabrication and Characterization of Thin-Barrier $ \hbox{Al}_{0.5}\hbox{Ga}_{0.5}\hbox{N/AlN/GaN}$ HEMTs

✍ Scribed by Felbinger, Jonathan G.; Fagerlind, Martin; Axelsson, Olle; Rorsman, Niklas; Gao, Xiang; Guo, Shiping; Schaff, William J.; Eastman, Lester F.

Book ID: 126500333
Publisher: IEEE
Year: 2011
Tongue: English
Weight: 141 KB
Volume: 32
Category: Article
ISSN: 0741-3106
DOI: 10.1109/LED.2011.2143384

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