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Fabrication and characterization of 4H-SiC P-N junction diodes by selective-epitaxial growth using TaC as the mask

✍ Scribed by C. Li; P. Losee; J. Seiler; I. Bhat; T. P. Chow


Book ID
107453418
Publisher
Springer US
Year
2005
Tongue
English
Weight
545 KB
Volume
34
Category
Article
ISSN
0361-5235

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