Extreme-ultraviolet interferometry at 155 nm using multilayer optics

✍ Scribed by Da Silva, L. B. ;Barbee, T. W. ;Cauble, R. ;Celliers, P. ;Ciarlo, D. ;Moreno, J. C. ;Mrowka, S. ;Trebes, J. E. ;Wan, A. S. ;Weber, F.

• Book ID: 115344529
• Publisher: The Optical Society
• Year: 1995
• Tongue: English
• Weight: 1017 KB
• Volume: 34
• Category: Article
• ISSN: 1559-128X
• DOI: 10.1364/AO.34.006389