✦ LIBER ✦
Extraction of MOSFET threshold voltage, series resistance, effective channel length, and inversion layer mobility from small-signal channel conductance measurement
✍ Scribed by Kong, F.C.J.; Yeow, Y.T.; Yao, Z.Q.
- Book ID
- 114538974
- Publisher
- IEEE
- Year
- 2001
- Tongue
- English
- Weight
- 126 KB
- Volume
- 48
- Category
- Article
- ISSN
- 0018-9383
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