Extraction of electric field in heavily irradiated silicon pixel sensors

✍ Scribed by A. Dorokhov; Y. Allkofer; C. Amsler; D. Bortoletto; V. Chiochia; L. Cremaldi; S. Cucciarelli; C. Hörmann; D. Kim; M. Konecki; D. Kotlinski; K. Prokofiev; C. Regenfus; T. Rohe; D. Sanders; S. Son; T. Speer; M. Swartz

• Book ID: 108219482
• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 696 KB
• Volume: 560
• Category: Article
• ISSN: 0168-9002
• DOI: 10.1016/j.nima.2005.11.247