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Extracting interaction forces and complementary observables in dynamic probe microscopy

โœ Scribed by Durig, U.


Book ID
115439318
Publisher
American Institute of Physics
Year
2000
Tongue
English
Weight
304 KB
Volume
76
Category
Article
ISSN
0003-6951

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Dynamic force microscopy has proved to be a powerful imaging tool. Here, the tip of an atomic force microscope is vibrated at a high frequency, typically the resonance frequency of the lever sensor, and at a large vibration amplitude, typically of the order of 10 nm. Imaging contrast is obtained fro