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Extensive investigations of temperature influence on barrier integrity during reliability testing

✍ Scribed by O. Aubel; M.A. Meyer; F. Feustel; H.J. Engelmann; I. Zienert; J. Poppe; H. Schmidt; D. Gehre; H. Geisler; E. Langer; P. Limbecker; T. Foltyn; C. Witt; W. Yao; S. Thierbach; F. Koschinsky; C. Zistl


Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
629 KB
Volume
85
Category
Article
ISSN
0167-9317

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