✦ LIBER ✦
Extending electrical resistivity measurements in micro-scratching of silicon to determine thermal conductivity of the metallic phase Si-II
✍ Scribed by Hisham A. Abdel-Aal; Ysai Reyes; John A. Patten; Lei Dong
- Book ID
- 113779964
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 620 KB
- Volume
- 57
- Category
- Article
- ISSN
- 1044-5803
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