✦ LIBER ✦
Extended metallization reliability testing: Combining standard wafer level with product tests to increase test sensitivity
✍ Scribed by V. Born; M. Beck; O. Bosholm; D. Dalleau; S. Glenz; I. Haverkamp; G. Kurz; F. Lange; A. Vest
- Book ID
- 108210793
- Publisher
- Elsevier Science
- Year
- 2009
- Tongue
- English
- Weight
- 377 KB
- Volume
- 49
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.