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Extended hubbard model analysis of semiconductor-alkali interfaces: implications for the metallization problem

โœ Scribed by J.M. Lopez Sancho; M.C. Refolio; M.P. Lopez Sancho; J. Rubio

Publisher
Elsevier Science
Year
1993
Weight
511 KB
Volume
285
Category
Article
ISSN
0167-2584

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The extended McEvily model for fatigue c
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โœ Yifei Wang; Weicheng Cui; Xiaoyuan Wu; Fang Wang; Xiaoping Huang ๐Ÿ“‚ Article ๐Ÿ“… 2008 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 259 KB

An extended McEvily model for fatigue crack growth analysis of metal structures is proposed in this paper. In comparing with our previous work, the extension is mainly concerned with the following two aspects: (1) the slope of the fatigue crack growth rate curve is regarded as a variable rather than