Extended bidirectional reflectance distribution function for subsurface defects scattering
✍ Scribed by Jian Shen; Shijie Liu; Weijin Kong; Zicai Shen; Jianda Shao; Jun Yao
- Book ID
- 104050480
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 399 KB
- Volume
- 83
- Category
- Article
- ISSN
- 0167-9317
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✦ Synopsis
By introducing scattering probability and statistical distribution functions of substrate subsurface defects' radiuses, refractive indices and positions, an extended bidirectional reflectance distribution function (BRDF) for polarized light scattering was derived on the foundation of Jones scattering matrix. A numerical calculation example for the case of p-polarization incident light has been performed via Monte Carlo method. The results indicate that the extended BRDF depends strongly on incident angle, scattering angle and azimuth angle, and presents a specific symmetry in terms of 180°(azimuth angle). For real refractive index, the extended BRDF is independent of subsurface defects' positions. And it will provide a more precise model for the calculation and measurement of polarized light scattering resulting from subsurface defects.