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Exploring the nonlinear effects of patent H index, patent citations, and essential technological strength on corporate performance by using artificial neural network

✍ Scribed by Zhang, Sifei; Yuan, Chien-Chung; Chang, Ke-Chiun; Ken, Yun

Book ID: 122525324
Publisher: Elsevier
Year: 2012
Tongue: English
Weight: 477 KB
Volume: 6
Category: Article
ISSN: 1751-1577
DOI: 10.1016/j.joi.2012.03.006

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