Explore the new relationship between patents and market value: a panel smooth transition regression (PSTR) approach

✍ Scribed by Chen, Yu-Shan; Shih, Chun-Yu; Chang, Ching-Hsun

• Book ID: 121422771
• Publisher: Springer Netherlands
• Year: 2013
• Tongue: English
• Weight: 375 KB
• Volume: 98
• Category: Article
• ISSN: 0138-9130
• DOI: 10.1007/s11192-013-1110-9