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Explorative statistical analysis of planar point processes in microscopy

✍ Scribed by T. MATTFELDT


Book ID
108864118
Publisher
John Wiley and Sons
Year
2005
Tongue
English
Weight
299 KB
Volume
220
Category
Article
ISSN
0022-2720

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## Abstract The paper presents a method for the second‐order analysis of point processes, and, basing on it, for their orientation analysis. For the reduced second moment measure of stationary and of stationary and isotropic point processes a new estimator is given, which has some advantages in com