✦ LIBER ✦
Explanation of current crowding phenomena induced by impact ionization in advanced Si bipolar transistors by means of electrical measurements and light emission microscopy
✍ Scribed by Paolo Pavan; Loris Vendrame; Stefano Bigliardi; Arlette Marty; Alain Chantre; Enrico Zanoni
- Publisher
- Elsevier Science
- Year
- 1992
- Tongue
- English
- Weight
- 334 KB
- Volume
- 19
- Category
- Article
- ISSN
- 0167-9317
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