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Experimental verification on the origin of plateau-like current–voltage characteristics of resonant tunneling diodes

✍ Scribed by Qiu, Z. J.; Gui, Y. S.; Guo, S. L.; Dai, N.; Chu, J. H.; Zhang, X. X.; Zeng, Y. P.


Book ID
118273235
Publisher
American Institute of Physics
Year
2004
Tongue
English
Weight
363 KB
Volume
84
Category
Article
ISSN
0003-6951

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