Experimental verification of theoretical cross sections for FIB–PIXE

✍ Scribed by Kenneth L. Streib; Terry L. Alford; James W. Mayer

• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 108 KB
• Volume: 249
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2006.03.087

✦ Synopsis

X-ray production cross sections were found for films of Cr, Cu, Ge, Ag, W and Au, using incident H + and Be + ions at energies from 300 keV to 3.5 MeV. These experimental cross section results were compared with the cross section results obtained using software which calculates inner shell ionization and X-ray production cross sections. The software uses the ECPSSR-UA approach to finding X-ray production cross sections. This program was found to be useful for predicting cross sections for H + and Be + ions at the energies in this study. The software was then used to predict results for Li + , Be + and B + ions at 280 keV, energies available in the Arizona State University focused ion beam laboratory.