Experimental verification of strain benefits in 1.5- mu m semiconductor lasers by carrier lifetime and gain measurements

✍ Scribed by Zou, Y.; Osinski, J.S.; Grodzinski, P.; Dapkus, P.D.; Rideout, W.; Sharfin, W.F.; Crawford, F.D.

• Book ID: 119783622
• Publisher: IEEE
• Year: 1992
• Tongue: English
• Weight: 433 KB
• Volume: 4
• Category: Article
• ISSN: 1041-1135
• DOI: 10.1109/68.180561