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Experimental verification of fault tolerant quantum key distribution protocol

✍ Scribed by Jiang, Yun-kun; Wang, Xiang-Bin; Shi, Bao-Sen; Tomita, Akihisa

Book ID: 115405760
Publisher: Optical Society of America
Year: 2005
Tongue: English
Weight: 99 KB
Volume: 13
Category: Article
ISSN: 1094-4087
DOI: 10.1364/OPEX.13.009415

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