✦ LIBER ✦
Experimental threshold voltage fluctuations of 30 nm-NMOS-transistors manufactured by a lithography independent structure definition process
✍ Scribed by John T. Horstmann; Klaus T. Kallis; Horst L. Fiedler
- Book ID
- 104052119
- Publisher
- Elsevier Science
- Year
- 2009
- Tongue
- English
- Weight
- 382 KB
- Volume
- 86
- Category
- Article
- ISSN
- 0167-9317
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