✦ LIBER ✦
Experimental study of nonstationary electron transport in sub-0.1 μm metalâoxideâsilicon devices: Velocity overshoot and its degradation mechanism
✍ Scribed by Mizuno, Tomohisa; Ohba, Ryuji
- Book ID
- 120589046
- Publisher
- American Institute of Physics
- Year
- 1997
- Tongue
- English
- Weight
- 317 KB
- Volume
- 82
- Category
- Article
- ISSN
- 0021-8979
- DOI
- 10.1063/1.366389
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