Experimental Study of Head-Disk Interface Flyability and Durability at Sub-1-nm Clearance

✍ Scribed by Ning Li; Lanshi Zheng; Yonggang Meng; Bogy, D.B.

• Book ID: 114653376
• Publisher: IEEE
• Year: 2009
• Tongue: English
• Weight: 734 KB
• Volume: 45
• Category: Article
• ISSN: 0018-9464
• DOI: 10.1109/tmag.2009.2024002