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Experimental study of charge generation mechanisms in power MOSFETs due to energetic particle impact

✍ Scribed by F. Velardi; F. Iannuzzo; G. Busatto; J. Wyss; A. Candelori


Book ID
108361955
Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
269 KB
Volume
43
Category
Article
ISSN
0026-2714

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