Experimental results on three-phase polysilicon CCD's with a TCE-SiO/SUB 2//Si/SUB 3/N/SUB 4/ gate insulator

✍ Scribed by Declerck, G.J.; de Meyer, K.M.; Janssens, E.J.; Laes, E.E.; van der Spiegel, J.

• Book ID: 119797470
• Publisher: IEEE
• Year: 1976
• Tongue: English
• Weight: 623 KB
• Volume: 11
• Category: Article
• ISSN: 0018-9200
• DOI: 10.1109/jssc.1976.1050703