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Experimental phase changes at the mica–silver interface illustrate the experimental accuracy of the central film thickness in a symmetrical three-layer interferometer

✍ Scribed by Farrell, Brenda ;Bailey, Anita I. ;Chapman, Dennis


Book ID
115344166
Publisher
The Optical Society
Year
1995
Tongue
English
Weight
154 KB
Volume
34
Category
Article
ISSN
1559-128X

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