Experimental observation of large-signal behavior in trapped domain transferred electron devices

✍ Scribed by Yokoo, K.; Ono, S.; Aishima, A.

• Book ID: 114593314
• Publisher: IEEE
• Year: 1980
• Tongue: English
• Weight: 733 KB
• Volume: 27
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1980.19841