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Experimental Investigation of Pulsed-Laser-Annealed Ultralow-Conduction-Loss 600-V Nonpunchthrough Insulated-Gate Bipolar Transistors

✍ Scribed by Kwang-Hoon Oh; Seung Chul Lee; Eun-Taek Kim; Jong Hun Lee; Kyu-Hyun Lee; Soo-Seong Kim; Chongman Yun


Book ID
118698609
Publisher
IEEE
Year
2007
Tongue
English
Weight
395 KB
Volume
54
Category
Article
ISSN
0018-9383

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