✦ LIBER ✦
Experimental Evaluation of Coulomb-Scattering-Limited Inversion-Layer Mobility of n-type Metal–Oxide–Semiconductor Field-Effect Transistors on Si(100), (110), and (111)-Surfaces: Impact of Correlation between Conductivity Mass and Normal Mass
✍ Scribed by Nakabayashi, Yukio; Ishihara, Takamitsu; Numata, Toshinori; Uchida, Ken; Takagi, Shinichi
- Book ID
- 119971704
- Publisher
- Institute of Pure and Applied Physics
- Year
- 2010
- Tongue
- English
- Weight
- 196 KB
- Volume
- 49
- Category
- Article
- ISSN
- 0021-4922
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