Experimental determination of valence band offset at PbTe/Ge(1 0 0) interface by synchrotron radiation photoelectron spectroscopy

✍ Scribed by C.F. Cai; H.Z. Wu; J.X. Si; W.H. Zhang; Y. Xu; J.F. Zhu

• Publisher: Elsevier Science
• Year: 2010
• Tongue: English
• Weight: 307 KB
• Volume: 256
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/j.apsusc.2010.03.119