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Experimental derivation of Auger transition probabilities from X-ray excited Auger electron spectra in XPS

✍ Scribed by A. Tanaka; T. Nakamura; K. Hirokawa


Publisher
Springer
Year
2000
Tongue
English
Weight
124 KB
Volume
366
Category
Article
ISSN
1618-2650

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High-energy Cu and Ni KLL Auger lines, excited by Mo and Cu bremsstrahlung, were measured for polycrystalline metallic samples as well as for thin (10 nm) films deposited onto Si substrates, to determine the respective Auger transition energies and probabilities. 1 The spectra of homogeneous samples