Experimental characterization of single-walled carbon nanotube film-Si Schottky contacts using metal-semiconductor-metal structures

✍ Scribed by Behnam, Ashkan; Johnson, Jason L.; Choi, Yongho; Ertosun, M. Günhan; Okyay, Ali K.; Kapur, Pawan; Saraswat, Krishna C.; Ural, Ant

• Book ID: 121300885
• Publisher: American Institute of Physics
• Year: 2008
• Tongue: English
• Weight: 723 KB
• Volume: 92
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.2945644