Experimental Characterization of Roughness Induced Scattering Losses in PECVD SiC Waveguides

✍ Scribed by Pandraud, G.; Margallo-Balbas, E.; Chung-Kai Yang; French, P.J.

• Book ID: 115373491
• Publisher: Optical Society of America
• Year: 2011
• Tongue: English
• Weight: 532 KB
• Volume: 29
• Category: Article
• ISSN: 0733-8724
• DOI: 10.1109/JLT.2011.2108264