Experimental characterization of coupling effects between two on-chip neighboring square inductors

✍ Scribed by Yin, W.Y.; Pan, S.J.; Li, L.W.; Gan, Y.B.

• Book ID: 114624181
• Publisher: IEEE
• Year: 2003
• Tongue: English
• Weight: 584 KB
• Volume: 45
• Category: Article
• ISSN: 0018-9375
• DOI: 10.1109/temc.2003.815597