✦ LIBER ✦
Experimental behavior of single-chip IGBT and COOLMOS devices under repetitive short-circuit conditions
✍ Scribed by Lefebvre, S.; Khatir, Z.; Saint-Eve, F.
- Book ID
- 114617696
- Publisher
- IEEE
- Year
- 2005
- Tongue
- English
- Weight
- 663 KB
- Volume
- 52
- Category
- Article
- ISSN
- 0018-9383
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