β Scribed by V. Offermann; P. Grosse; M. Feuerbacher; G. Dittmar
No coin nor oath required. For personal study only.
It is well known that attenuated total reflectance (ATR) infrared spectroscopy is a very sensitive technique for the investigation of thin films. In this paper it is shown that additional internal reflection measurements below the critical angle are generally necessary for a quantitative interpretation of the ATR spectra. In the case of very thin layers configurations are found which are very sensitive on undesired residual vacuum gaps in the 10-nm range between a solid sample and the ATR prism. On the other hand, in experiments where surface polaritons are excited a coupling gap with a thickness on the order of 100-1000 nm is necessary between sample and prism (Otto geometry). The thickness of this layer can be obtained by evaluating the Fabry-Perot interferences which occur inside the coupling gap if the angle of incidence is below the critical angle.
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