Experimental and theoretical characterization of thick and thin films for microwave uses on 99.6% alumina substrates : J. P. Ramy, R. Schnitzler and C. Thebault. Electrocomponent Sci. Technol.10, 157 (1983)

• Book ID: 103277736
• Publisher: Elsevier Science
• Year: 1983
• Tongue: English
• Weight: 124 KB
• Volume: 23
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(83)90948-4