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Experimental analysis of current conduction through thermally grown SiO2on thick epitaxial 4H-SiC employing Poole-Frenkel mechanism

✍ Scribed by Sanjeev K. Gupta; A. Azam; J. Akhtar


Book ID
107588713
Publisher
Springer-Verlag
Year
2010
Tongue
English
Weight
364 KB
Volume
74
Category
Article
ISSN
0304-4289

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