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Experiment of substrate integrated waveguide interconnect measurement for high speed data transmission application

✍ Scribed by Zhaolong Li; Mohammad S. Mahani; Ramesh Abhari

Publisher: John Wiley and Sons
Year: 2011
Tongue: English
Weight: 725 KB
Volume: 54
Category: Article
ISSN: 0895-2477
DOI: 10.1002/mop.26521

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✦ Synopsis

Abstract

Substrate integrated waveguide (SIW) has been used as a high speed interconnect for digital applications. The output eye diagram is an important indicator for evaluating the performance of the interconnect and the design of the driver and receiver units. This article studies the effect on eye diagrams based on improved driver and receiver design for a SIW interconnect system. © 2011 Wiley Periodicals, Inc. Microwave Opt Technol Lett, 2012

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