Expanding the measurement range of a critical-angle refractometer through Fourier analysis

✍ Scribed by Ye, Junwei; Xia, Min; Liu, Hao; Li, Wei; Guo, Wenping; Xiong, Changxin; Yang, Kecheng

• Book ID: 121385864
• Publisher: EDP Sciences
• Year: 2013
• Tongue: English
• Weight: 897 KB
• Volume: 104
• Category: Article
• ISSN: 0295-5075
• DOI: 10.1209/0295-5075/104/20001