Structural distortions of semiconducting
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A. O. Aboyan; S. G. Aghbalyan
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Article
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2010
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John Wiley and Sons
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English
β 302 KB
## Abstract Structural distortions in nonpolar, particularly, in semiconducting silicon crystals, caused by constant electric field have been disclosed by means of Xβray interferometry. It was shown that in the field both the direction of moirΓ© fringes and the frequency (period) are changed, and th