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Excite-probe FEL (CLIO) study of two-photon-induced carrier dynamics in narrow gap semiconductors

✍ Scribed by B.N. Murdin; R. Rangel-Rojo; C.R. Pidgeon; M.F. Kimmitt; A.K. Kar; D.A. Jaroszynski; J-M. Ortega; R. Prazeres; F. Glotin; D.C. Hutchings


Book ID
107922455
Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
267 KB
Volume
341
Category
Article
ISSN
0168-9002

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