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Excimer-laser-induced permanent electrical conductivity in solid C60films

โœ Scribed by D. Ning,Q. H. Lou,J. X. Dong,Y. R. Wei

Book ID
118290300
Publisher
Springer
Year
1996
Tongue
English
Weight
372 KB
Volume
62
Category
Article
ISSN
1432-0630

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Pristine CsO films, which were sublimed onto Si( loo), were implanted with 20 keV K+ ions at a dose of 2.7x 1016/cm2. The distribution of K+ and contamination of oxygen were studied using Rutherford backscattering. The four-probe technique was used to measure the sheet resistance of the films, and t