Exchange biasing in NiFe/FeMn/NiFe with Si seed and capping layers

✍ Scribed by D.G. Hwang; S.W. Kim; B.K. Kim; J.Y. Lee; J.K. Kim; J.R. Rhee; S.S. Lee

• Book ID: 108183781
• Publisher: Elsevier Science
• Year: 2004
• Tongue: English
• Weight: 189 KB
• Volume: 272-276
• Category: Article
• ISSN: 0304-8853
• DOI: 10.1016/j.jmmm.2003.12.723