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Exchange-biased magnetic tunnel junctions and application to nonvolatile magnetic random access memory (invited)

✍ Scribed by Parkin, S. S. P.; Roche, K. P.; Samant, M. G.; Rice, P. M.; Beyers, R. B.; Scheuerlein, R. E.; OSullivan, E. J.; Brown, S. L.; Bucchigano, J.; Abraham, D. W.; Lu, Yu; Rooks, M.; Trouilloud, P. L.; Wanner, R. A.; Gallagher, W. J.


Book ID
115508496
Publisher
American Institute of Physics
Year
1999
Tongue
English
Weight
941 KB
Volume
85
Category
Article
ISSN
0021-8979

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