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Exchange bias in a ferromagnetic semiconductor induced by a ferromagnetic metal: Fe/(Ga,Mn)As bilayer films studied by XMCD measurements and SQUID magnetometry

✍ Scribed by Olejnik, K.; Wadley, P.; Haigh, J. A.; Edmonds, K. W.; Campion, R. P.; Rushforth, A. W.; Gallagher, B. L.; Foxon, C. T.; Jungwirth, T.; Wunderlich, J.; Dhesi, S. S.; Cavill, S. A.; van der Laan, G.; Arenholz, E.


Book ID
119951140
Publisher
The American Physical Society
Year
2010
Tongue
English
Weight
226 KB
Volume
81
Category
Article
ISSN
1098-0121

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