✦ LIBER ✦
Exchange bias affected by ion beam etching of FeMn surface in Ta/NiFe/FeMn
✍ Scribed by Yoon, S. M. ;Lim, J. J. ;Lee, Y. W. ;Kim, C. G. ;Kim, C. O.
- Book ID
- 105361997
- Publisher
- John Wiley and Sons
- Year
- 2004
- Tongue
- English
- Weight
- 158 KB
- Volume
- 201
- Category
- Article
- ISSN
- 0031-8965
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