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Excess noise measurements in ion-implanted silicon resistors : H. R. Bilger, J. L. Tandon and M. A. Nicolet. Solid St. Electron. 17, 599 (1974)

Publisher: Elsevier Science
Year: 1974
Tongue: English
Weight: 108 KB
Volume: 13
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(74)90098-5

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