Excess currents induced by hot hole injection and FN electron injection in thin SiO2 films

✍ Scribed by Teramoto, A.; Kobayashi, K.; Ohno, Y.; Shigetomi, A.

• Book ID: 114538650
• Publisher: IEEE
• Year: 2001
• Tongue: English
• Weight: 139 KB
• Volume: 48
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.918233