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Excess carrier cross-sectional profiling technique for determination of the surface recombination velocity

✍ Scribed by E. Gaubas; J. Vaitkus; E. Simoen; C. Claeys; J. Vanhellemont

Book ID: 104420496
Publisher: Elsevier Science
Year: 2001
Tongue: English
Weight: 197 KB
Volume: 4
Category: Article
ISSN: 1369-8001
DOI: 10.1016/s1369-8001(00)00140-2

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