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Examination of the relationship between phase shift and energy dissipation in tapping mode atomic force microscopy by frequency-sweep and force-probe measurements

✍ Scribed by Georg Bar; Rainer Brandsch; Matthias Bruch; Lydie Delineau; M.-H. Whangbo

Book ID: 117220102
Publisher: Elsevier Science
Year: 2000
Tongue: English
Weight: 164 KB
Volume: 444
Category: Article
ISSN: 0039-6028
DOI: 10.1016/s0039-6028(99)00975-9

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